Product Features

The TCT-3 thin film thermal conductivity testing system uses the 3 ω testing method to detect the thermal conductivity of micro/nano thin film materials by detecting the changes in the heater electrical signal caused by thermal conductivity.

The thermal conductivity test of thin film materials is achieved by measuring the electrical signal changes caused by temperature changes during the heat transfer process, rather than directly measuring temperature changes.

High precision digital source meter combined with lock-in amplification technology to ensure the accuracy of measurement results.

The optimized shape and size design of the heating electrode can ensure the uniformity of heating and the stability of testing applications.